Introduction

Highlights of this issue include new product releases from Anritsu Company, Tektronix, STMicroelectronics and JTAG Technologies; design features on PXI’s hidden role in communications-standards test and simultaneous-sampling ADCs to monitor three phase ac-line power; test and measurement-related design ideas; schedule of the Metrology-2010 exhibition and the SAS-2010 forum; and research studies on the European semiconductor automated test equipment markets.


 

9 March 2010

Current sensors allow precise measurement of high currents
Developed and manufactured by Hitec Power Protection, the new Zero-Flux current sensors allow the precise measurement of currents up to several thousands of amperes – including simultaneous measurement of AC and DC currents - while also providing accurate phase-shift information.
Yokogawa

R&TTE approved LTE RF conformance test system
Anritsu has announced that its ME7873L LTE RF conformance test system has achieved European R&TTE (Radio equipment and Telecommunications Terminal Equipment) approval for its test functions for next-generation LTE devices.
Anritsu

Test mobile for rapid deployment of LTE networks
mimoOn has demonstrated the 4G capabilities of its mi!TestMOBILE, a small and low-cost test mobile for the rapid deployment and optimisation of LTE networks. The R&S CMW500 wideband radio communication tester from Rohde & Schwarz was used for the demonstration.
mimoOn

Three-axis digital accelerometers
STMicroelectronics has unveiled details of its new family of three-axis digital accelerometers that combine small footprints with reduced current consumption and enhanced functionality.
STMicroelectronics
 

Test & Measurement World: Windows 7 for test applications
A recent discussion on a LabView user group revealed that engineers are starting to use Windows 7 for controlling instruments. Many automated measurement systems, however, will continue to run Windows XP or perhaps an older version of Windows for as long as the systems are useful.

Test & Measurement World: Anechoic Chambers Rise From The Pits
Tests for electromagnetic immunity and emissions work best when located far from intentional transmitters such as broadcast stations and cell towers. Testing products for emissions or immunity in populated areas requires an anechoic or semianechoic chamber to keep ambient signals from interfering with measurements.
 

BAKER’S BEST: From high to low frequencies with IBIS
One challenge that high-speed-digital-system designers have is tackling overshoot, undershoot, mismatchedimpedance ringing, jitter distribution, and crosstalk problems on their PCBs (printed-circuit boards). These problems fall into the category of signal integrity.

Under The Lid Analog Test Is Suddenly The Critical Ingredient
TPG (automatic-test-pattern generation), BIST (built-in self-test), and structural-test techniques have kept digital-test costs nearly constant during the explosion in digital complexity. Without these tools, however, as analog complexity starts to grow rapidly, analog- test cost is growing, too.
 

Metrology 2010, 18 - 20 May 2010 at Moscow, Russia
The 6th International Competitive Exhibition of Measuring Tools, Testing and Laboratory Equipment “Metrology-2010” and the 2nd Moscow International Symposium of Metrologists will be held from May 18 to May 20, 2010, at the All-Russia Exhibition Center. The exhibition “Metrology” offers over 200 participating companies from 12 to 14 countries of the world, up to 20 collective expositions of federal agencies and establishments, public corporations, major holding companies and associations, over 50 regional standardization, metrology and certification centers and metrological institutes, with over 6,500 visitors attending.

SENSORCOMM 2010, 18-25 July 2010 at Venice, Italy
The SENSORCOMM 2010 (The Fourth International Conference on Sensor Technologies and Applications) is a multi-track event covering related topics on theory and practice on wired and wireless sensors and sensor networks.
 

High Voltage Test Equipment Industry Report
1 in 15 companies in the UK High Voltage Test Equipment industry could change ownership as a result of the current economic climate, claims a new study by leading financial analysts Plimsoll. With a surprising number of cash rich competitors waiting in the wings the market could be set for a prolonged period of consolidation.
 

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