Introduction

Highlights of this issue include new product releases from LeCroy, Anite, Prism Sound and LEM; design features on different analytical instruments and revised EMC standard; test and measurement related design ideas; schedule of the Gyro Technology 2009 symposium and the productronica 2009 trade fair; and research studies on worldwide nanotechnology mid IR sensor markets.
 

16 September 2009

uperSpeed USB Test Suite
LeCroy has announced what it terms a “single-source lineup” of test instruments to support the USB (Universal Serial Bus) 3.0 standard, also known as SuperSpeed USB. The package comprises an integrated selection of test instruments – with appropriate software – that addresses all USB3.0 transmitter, receiver, TDR and protocol tests.
LeCroy

Network simulation solution
Anite has launched its ‘SAS-Lite’ network simulation solution that is designed to expand the range of real-world testing options and support rapid product development. The solution offers all the high-end features of the company’s interoperability tool ’SAS’ and creates a flexible upgrade path.
Anite

Measurement system for audio generation and analysis
Prism Sound’s dScope series III has been adopted by Harman/Becker Automotive Systems as its new audio analyser for all production testing at its factories in Europe, North America and China. The dScope series III is a comprehensive measurement system for analogue and digital audio generation and analysis, including digital audio carrier analysis, acoustic transducer testing and testing of Windows sound devices.
Prism Sound

Wireless sub-metering components
LEM has expanded its Wi-LEM (Wireless Local Energy Meter) family with the addition of the Wi-Pulse and Wi-Zone to allow the remote measurement and monitoring of electricity, water, temperature and humidity. The devices allow industrial and commercial enterprises to break down energy and water usage, and identify the areas of efficiency improvement.
LEM
 

Test & Measurement World: From microwave microscopy to 110-GHz analysis at IMS At the symposium, some of the highlights included Keithley Instruments displaying its Model 2820A RF vector signal analyzer and introducing its Model 2891-IQ upconverter. Agilent Technologies exhibited nonlinear measurements and scanning microwave microscopy. AWR introduced its AWR Connected for Rohde & Schwarz software.

Test & Measurement World: US Military EMC Standard gets a revision
MIL-STD-461, “Requirements for the Control of Electromagnetic Interference Characteristics of Subsystems and Equipment,” has long defined military EMC (electromagnetic-compliance) tests. With version F, the standard incorporates numerous changes—both significant and minor—and reinstates an old test method.

Circuit eases power-sequence testing
Systems on Chip (SoCs) normally require one power supply for the core and another for I/O. To properly apply power to the device, you often need one supply to apply power before the other. The circuit lets you test the power sequencing of the SoC. Two TPS75501 linear regulators, IC3 and IC4, generate two power supplies. The TPS75501 adjustable regulator provides output voltages of 1.22 to 5V from a maximum input of 6V.

A fail-safe approach to LEDs
Spurred by the increasing cost of energy and concerns about climate change, governments and industry are pushing for higher-efficiency lighting. HB LEDs (high-brightness light-emitting diodes) provide an excellent option due to their high efficiency and long lifetime. At the same time, LED technology is undergoing a period of rapid change and innovation.
 

Symposium Gyro Technology 2009, 22-23 September 2009 at Karlsruhe, Germany
At this symposium the latest state of gyro technology (including inertial navigation systems and components as well as optical rate sensors) will be presented. This includes applications of this technology, the development of new systems, components and test procedures as well as investigations on cost and marketing aspects.

productronica 2009, 10-13 November 2009 at Munich, Germany
productronica is an international trade fair for innovative electronics production. The range of exhibits includes PCB and other circuit-carrier manufacturing and soldering technology, cable-processing and component-mount technologies, measuring and testing technology and quality assurance.
 

Worldwide Nanotechnology Mid IR Sensor Market Shares Strategies, and Forecasts, 2009 to 2015
This new study provides worldwide nanotechnology mid IR sensor markets. Mid IR sensors are poised to achieve significant growth as sensors become less expensive to manufacture and are smaller and portable. The ability to measure chemicals and light sources as heat is anticipated to drive market growth at a rapid pace. Force protection addresses asymmetric threats worldwide.
 

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