Introduction

Highlights of this issue include new product releases from Bosch Sensortec, RS Components, Yokogawa and Anritsu; design features on testing the tester components and PXI test system; test and measurement related design ideas; schedule of the BIODEVICES 2010 and the ICONS 2010 conferences; and research studies on the 2010 report on LAN/WAN test equipment.


 

18 Novembre 2009

High sensitivity MEMS acceleration sensor
The new, triaxial BMA180 acceleration sensor from Bosch Sensortec measures 3x3x0.9mm in its LGA housing and reacts sensitively to even the smallest of movements. In the 2g measuring range, minimal accelerations of 0.00025g and tilt changes in the field of gravity of 0.25º can be reliably detected using its 14bit measurement dynamic.
Bosch Sensortec


Dual-channel, colour screen oscilloscopes
RS Components has expanded its test and measurement portfolio with the introduction of products from LeCroy. LeCroy’s oscilloscopes provide large colour screens with many integrated simple-to-use tools to meet design and development engineers analysis requirements.
RS Components


Precision power analyser facilitates transformer testing
The new Yokogawa WT3000T is a precision power analyser specifically targeted at the needs of the power transformer industry. Based on the company’s WT3000 instrument, the new instrument combines better accuracy and long-term stability with the ability to carry out measurements at low power factors.
Yokogawa


Multiport vector network analysers
Anritsu has introduced two low-end frequency models to its MN469xB VectorStar four-port test sets. These instruments are multiport VNA (vector network analyser) solutions and measure down to 70kHz. The series combines DC coverage and the dynamic range time domain capability of a VNA, and measures signal integrity.
Anritsu
 

Test & Measurement World: Testing the tester components
Peregrine Semiconductor builds a range of RF switches and other devices based on its UltraCMOS solid-state SOS (silicon-on-sapphire) process, which integrates ultra-thin silicon CMOS circuitry on a dielectric sapphire substrate. The company’s SOS devices operate beyond 10 GHz and at power levels greater than 40 dBm.


Test & Measurement World: Production test evolves with PXI
Through a recent collaboration (Reference 1), Geotest–Marvin Test Systems and JTAG Technologies integrated one of JTAG’s boundary-scan controllers into Geotest’s preconfigured PXI test system for the production floor. This suggests that PXI may be moving into new realms in manufacturing test.

Characterizing noise in high-performance voltage-reference ICs
Voltage-reference stability and noise frequently define the measurement limits of instrumentation systems. In particular, reference noise often sets stable resolution limits. Reference voltages have decreased with the continuing drop in system power-supply voltages, making reference noise increasingly important.


Emulate SPI signals with a digital-I/O card
A design-verification tester for millimeter-wave SoC (Systemon- Chip) devices needed to combine switching, electrical measurements, temperature measurement, a paralleldigital interface, and a serial-digital interface into one instrument. To minimize rack space, the circuit uses an Agilent Technologies 34980A multifunction mainframe because its plug-in cards could support a force/sense dc matrix and multiplexed temperature measurements.
 

BIODEVICES 2010, 20-23 January 2010 at Valencia, Spain
The purpose of the International Conference on Biomedical Electronics and Devices is to bring together researchers and practitioners from electronics and mechanical engineering, interested in studying and using models, equipments and materials inspired from biological systems and/or addressing biological requirements.


ICONS 2010, 11-16 April 2010 at Alps, France
The International Conference on Systems continues a series of events covering a broad spectrum of topics. The conference covers fundamentals on designing, implementing, testing, validating and maintaining various kinds of software and hardware systems.
 

The 2010 Report on LAN/WAN Test Equipment: World Market Segmentation by City This study covers the world outlook for LAN/WAN test equipment across more than 2000 cities. For the year reported, estimates are given for the latent demand, or potential industry earnings (P.I.E.), for the city in question (in millions of U.S. dollars), the percent share the city is of the region and of the globe. These comparative benchmarks allow the reader to quickly gauge a city vis-à-vis others.
 

▪ To forward this Newsletter to a colleague
▪ To subscribe to the newsletter and the magazine

| profile |privacy |questions?|
EDN Europe| EPN France | EPN

          © 2009 EDNEurope is a trademark of Reed Business Information
Reed Business Information - 2, rue Maurice Hartmann – BP 62 – 92 133
Issy-les-Moulineaux cedex - FRANCE
Tel: +33 1 46 29 46 29 – Fax: + 33 1 46 29 23 50
VAT: FR 66 339 611 956, RCS Nanterre B 339 611 956
---------------------------------------------------------------------------------------------------------------
This is not an unsolicited message. It is part of EDN Europe’s (Electronic Design News) information program designed to keep its subscribers up-to-date with products, services and events related to their areas of professional interest.