Introduction

Highlights of this issue include new product releases from LEM, Analog Devices, Willtek Communications and Maxim Integrated Products; design features on 4G technology and PCI card slots; test and measurement related design ideas; schedule of SPIE Europe Optical Metrology and 15th Annual IMS3TW ‘09; and research studies on portable analysis instrumentation.
 

20 May 2009

Accurate current measurements to 4000A
LEM’s ITL 4000-S is a current transducer for non-invasive measurement of currents up to 4000 ARMS in conductors of up to 268mm diameter. It makes isolated measurements of AC, DC and pulsed currents, up to three times the nominal value for peak measurement, at frequencies up to 50kHz (±1dB).LEM

Programmable MEMS shock and vibration sensors
Analog Devices has added two MEMS sensors to its range of iSensor products, in this case for different functions in industrial shock and vibration sensing. Both are inertial sensors (accelerometer-based) devices; an ADI spokesman says that the industrial market for such MEMS-based products is, “largely untapped”.Analog Devices

Multifunction RF tester tests conventional and digital two-way radios
Willtek Communications has introduced the 2801 Multilock, a small, lightweight communication tester providing many test capabilities in a single instrument. Multilock is designed to support service shops repairing radio terminals and other RF equipment, up to 3GHz. The 2801 Multilock is a future-proof service tester because it supports digital and conventional two-way radio systems.Willtek Communications

Mixed-signal microcontroller for sensor applications
Maxim Integrated Products has announced the newest member of its MAXQ RISC microcontroller product line. The MAXQ7670 SoC, mixed-signal microcontroller is suitable for sensor applications. The MAXQ7670A is a highly sensitive, cost-effective automotive microcontroller for low-amplitude signals and delivers a low-cost, complete system solution for measuring signals in the microvolt range from sensors with differential outputs, such as AMR (anisotropic magnetoresistive) sensors. Maxim Integrated Products
 

Getting to 4G through Design and Test
The print version of this directory serves only to set out—with a few highlights of key announcements that vendors have made during the past year—to list the companies that the Web version of this directory, at www.edn.com/dspdirectory, covers in detail. The Web version has taken on more importance as the company roster continues to expand the material well beyond the capacity of the print update.

Test & Measurement World: PCI card slots are still available
Recently, I visited an online forum where one engineer asked for options for duplicating an existing PCbased test system that has four PCI expansion slots. His problem: Consumer-grade desktop PCs still have expansion slots, but not that many. If you look at new Dell or HP desktop PCs, you’re unlikely to find any with more than two expansion slots.
 

Diagnose LEDs by monitoring the switch-mode duty cycle
Engineers often monitor the forward voltage, VF, of HB LEDs (high-brightness light-emitting diodes) to assess the LEDs’ health. Big changes in forward voltage can indicate deterioration or even a complete failure of one or more LEDs connected in series. For several LEDs in series, the sum of their forward voltages can reach 40V or more, and, if you do not reference that voltage to ground, it requires a differential measurement.

Instrumentation amplifier compensates system offset from single supply
Many integrated instrumentation amplifiers have architectures that permit offset compensation. The reference terminal’s voltage, VREF, adds in phase to the output to yield a gain of one. As a result, you can reset the output offset voltage by applying to the VREF input a correction voltage of equal value but of opposite polarity. If the instrumentation amp operates from a dual-supply voltage, you can easily provide both positive- and negative-correction voltage.
 

SPIE Europe Optical Metrology, 14-18 June 2009 at Munich, Germany
SPIE Europe Optical Metrology brings together scientists, engineers, researchers and applications or product developers engaged in optical metrology, optical measurement systems and optics for arts, architecture and archaeology.

SENSOR+TEST 2009, 26-28 May 2009 at Nuremberg, Germany
The SENSOR+TEST 2009 conference provides emphasis on sensor technology and application, optical measuring technology and infrared measuring technology. The conference will offer technical solutions for measuring, testing and monitoring tasks in all industrial sectors.

Portable Analysis Instrumentation: The Global Market
This report presents an overview of the markets for equipment and systems sold for terrestrial, oceanic and atmospheric sensing. This study also forecasts sales in the global market for environmental sensing and monitoring through 2014, focuses on areas impacted by environmental sensing including vehicular emissions, burning of fossil fuels, agricultural runoff, industrial and mine waste disposal, ocean spilling and dumping, and climate change and weather monitoring.
 

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