| Dear Sir/Madam
Communication
technology plays an important roll in test & measurement.
Whether you use specialised instruments to test communication
devices or you use communication technology to link these instruments
to automated test systems. This newsletter shows you some exiting
result of this trend. Enjoy!
Wolfgang
Patelay
Technical Editor, EPN
Ultra-Deep-Memory
Oscilloscope (Agilent)
With
1 billion acquisition samples (1Gpt), the Agilent Infiniium
90000A oscilloscope series not only offers the world's deepest
acquisition memory depth, but also offers the world's first
hardware/software integrated triggering system, InfiniiScan
Plus.
Click
here
Serial-Analyser
Solutions (Tektronix)
The
TLA7S16 and TLA7S08 serial-analyser solutions offer test and
validation of PCI Express versions 1.0 and 2.0. Unlike competing
protocol analysers, these products provide detailed version
2.0 protocol information along with cross-bus analysis. In addition
to the serial analysers, the P6716/P6708 mid-bus probes and
pre-release slot-interposer probes are available to test and
validate all layers of this high-data-rate serial protocol.
Click
here
USB
Protocol Analyser (LeCroy)
LeCroy
has released software enhancements that add native support for
Windows Vista to its USB-analyser family. This new USB software
release (version 2.5) is available for download now and also
includes new device-class decodes for specialised upper-level
protocols, including IP, IrDA, ATAPI, and HTTP.
Click
here
True-RMS
Logging Multimeters (Fluke)
Fluke
has announced two new true-RMS logging multimeters that incorporate
advanced data logging and Trend Capture to help engineers and
technicians track down problems faster. An extra-large screen
shows results graphically, backed by an enhanced user interface
with on-board help available in seven languages, as well as
a soft-key interface.
Click
here
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Pulse
Testing for Nanoscale Devices
The
field of nanoelectronics is developing especially rapidly with
potential impact across a wide range of industries. Nanoelectronics
research today includes devices that utilise carbon nanotubes,
semiconductor nanowires, molecular organic-based electronics,
and single-electron devices. Unfortunately, these smaller devices
can't be tested using standard test techniques for a number
of reasons. Consequently, designers need new testing techniques
and test tools. One such technique is pulse testing which is
described by Jonathan Tucker from Keithley Instruments in his
article.
Click
here
Communications-centric
Test gear: sharpens symbol recognition
Designers
pursue next generation wireless developments with modulation-aware
test tools, though evolving standards present problems from
the Phy to the data layers. The cover story by Editorial Director
Maury Wright in EDN gives a look
at some sample tools and usage scenarios that may help your
next design project.
Click
here
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Dual-input
sample-and-hold amplifier uses no external resistors
At
least two classic ways exist to address applications requiring
sampling of a sum of analogue voltages. The most common way
is to cascade a classic analog adder and a sample-and-hold amplifier.
Another possibility is to use one amplifier per channel and
add their outputs in a classic analogue adder. Although this
configuration avoids the problem with the high relative error
of output voltage when input voltages are similar in magnitude
and opposite in polarity, precision resistors in the adder still
dissipate power. You can avoid these problems by using the circuit
configuration in the Design Idea by Marián Štofka, Slovak University
of Technology, Bratislava, Slovakia, which uses no external
resistors.
Click
here
Improved
optocoupler circuits reduce current draw, resist LED aging
It
seems deceptively simple to establish galvanic isolation with
the help of optocouplers between circuits that operate at different
ground potentials. Optocouplers draw power from the isolated
circuit, and switching can be relatively slow and uncertain
because of LED aging. Substitutes without opto-couplers are
available. This Design Idea by Peter
Demchenko, Vilnius, Lithuania
describes
a method of improving the simple optocoupler.
Click
here
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Book of The Month |
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System-on-Chip
Test Architectures, by Laung-Terng Wang, Charles E. Stroud and
Nur A. Touba
Modern
electronics testing has a legacy of more than 40 years. The
introduction of new technologies, especially nanometer technologies
with 90nm or smaller geometry, has allowed the semiconductor
industry to keep pace with the increased performance-capacity
demands from consumers. As a result, semiconductor test costs
have been growing steadily and typically amount to 40% of today?s
overall product cost. This book is a comprehensive guide to
new VLSI Testing and Design-for-Testability techniques that
will allow students, researchers, DFT practitioners, and VLSI
designers to master quickly System-on-Chip Test architectures,
for test debug and diagnosis of digital, memory, and analog/mixed-signal
designs.
Click
here
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Competition |
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Win
an arbitrary waveform generator
One
lucky EPN reader will be taking home a fully operational AFG3021B
function, pulse, and arbitrary waveform generator from Tektronix,
worth over 1600 euros. To qualify for the prize draw, check
out the reader offer online and click on the "Get the Datasheet"
button. Your email will automatically be entered in the draw.
Click
here
Copyright 2008, Reed
Business Information.
EPN and EDN Europe are members of the Reed Electronics Group
Reed Business France - 2 rue Maurice Hartmann, 92133 Issy-les-Moulineaux,
France
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