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Dear Sir/Madam
Network technology is conquering the whole electronics industry.
With the new standard LXI even test & measurement. In this
vertical newsletter youŽll find some additional news aboet this
topic. Enjoy!
Wolfgang Patelay
Technical Editor, EPN
Electrical Safety Testers (Clare Instruments)
The SafeTest
Luminaire benchtop tester provides a complete suite of
electrical safety tests to enable manufacturers and distributors
of lighting products to comply with the Lighting Association
Code of Practice, the LIF recommendations and all relevant
international technical conformance standards (typically EN
60598, UL 1598 and CSA C22.2).
Click here
Calibration Services (Roxspur Measurement)
Roxspur Measurement
& Control has developed a new computer system to improve the
efficiency and timeliness of the external service team by
simplifying and computerising the processes. In this system, full
details of the calibration requirements for a customer are
transmitted to the engineers wirelessly through their handheld
computers and returned in the same way.
Click here
Data-Acquisition Software (Yokogawa)
DAQWORX is a
PC-based integrated data-acquisition software package for acquiring
and recording data from equipment used in the production and
Research & Development environments. The tool suite allows users to
configure a variety of data-acquisition systems without having to
perform any special programming tasks.
Click here
Low-Footprint Oscilloscopes (LeCroy)
LeCroy expanded its product offering with three
oscilloscope models, bringing its big-display/small-footprint form
factor to the 2GHz performance. With the four-channel units
WaveRunner 104Xi (1GHz, 5GSamples/s model), WaveRunner 204Xi (2GHz,
5GSamples/s model) and WaveSurfer 104Xs (1GHz, 2.5GSamples/s model),
the company is also launching WaveScan, an advanced search and
analysis feature that now comes as standard on all WaveSurfer Xs and
WaveRunner Xi oscilloscopes.
Click here
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NI Signal Processing, Analysis and Math Resource Kit Download
the Signal Processing, Analysis and Math Resource Kit to learn
how LabVIEW can help make sense out of raw data you need to
manipulate, process, and analyze acquired data and extract
information. View a tutorial, read a technical white paper, or
watch a web presentation to learn about built in alternatives
such as graphical dataflow programming and textual MathScript.
Download the resource kit today.
Click here
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Understanding LXI
With the
introduction of LXI (LAN extensions for instruments) the test
industry has taken a major step forward in embracing
computer-based standards. To the test engineer, these promise
significant benefits in ease of use, performance, scalability,
longevity, flexibility and space. The LXI standard revolves
around four main areas: physical requirements, Ethernet
protocols, LXI interfaces, and LXI triggering.
Grant Drenkow from Agilent
Technologies gives a detailed insight in all of these areas of
this new standard in his article in EPN.
Click here
Architecture For Extended JTAG / Boundary Scan
The standardization
of IEEE-Std. 1149.1 (JTAG/Boundary Scan) in 1990 set the foundation
for one of the most successful test technologies. Additional
standards, based on the IEEE-Std. 1149.1 architecture, have been
developed to support innovative test and in-system programming
applications, in particular IEEE-Std. 1532, IEEE-Std. 1149.4, and
IEEE-Std. 1149.6, and further standard development efforts are under
way. Wenzel Thomas from Goepel Electronic
describes a new Architecture for JTAG/Boundary Scan systems
in his article in EPN.
Click here
Three-phase sinusoidal-waveform generator uses PLD
Using the
circuit in this Design Idea by
Eduardo Perez-Lobato,
University of Antofagasta, Antofagasta, Chile,
you can develop and implement a lightweight, noiseless,
inexpensive, three-phase, 60-Hz sinusoidal-waveform voltage
generator.
Click here
Fast-settling picoammeter circuit handles wide voltage range
Evaluating analog
switches, multiplexers, operational amplifiers, and other ICs poses
challenges to IC-test engineers. A typical test scenario requires
application of a test or forcing voltage to a device's input and
measurement of any resultant leakage and offset currents, often at
levels of 1 pA or less. In contrast to slow and expensive
commercially available automated testers, the low-power measurement
circuit in this Design Idea by
Rob Whitehouse from
Analog Devices
can force a wide range of test voltages and offer fast settling to
maximize device-test throughput.
Click here
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4| Book of The Month |
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Electronics for Service Engineers, by Joe Cieszynski
Electronics for Service Engineers is the first text designed
specifically for the Level 2 NVQs in Electronics Servicing. It
provides the underpinning knowledge required by brown goods and
white goods students, reflecting the popularity of the EMTA
white goods NVQs. It has also been written in the light of the
new EEB / City & Guilds Level 2 progression award (RVQ) for
brown goods and commercial electronics, dubbed 'son of 2240',
and the existing 2240 part 1.
Click here
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